English Abstract

Morphological Observation of Soft Material by using Electron Microscope

Atsushi KATO
NISSAN ARC, LTD., Yokosuka, Kanagawa, Japan
Nippon Gomu Kyokaishi,(2017),90(12),583-590 General Review in Japanese

An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. In particular, in this report, we introduce preprocessing methods and observation cases specialized in soft materials such as plastics and rubber.

Keywords: Electron Microscopy, SEM, TEM, Soft Material, Morphology