English Abstract
Recent Progress of Surface Analysis of Polymers 3. Microscopic Analysis
Shin-ichi KIMURA
JSR Corporation, Material Characterization and Analysis Laboratory, Yokkaichi, Mie
Nippon Gomu Kyokaishi,(2006),79(7),374-379 General Review in Japanese

Analytical methods which are and will be applied to the microscopic analysis of organic materials and polymers are explained along with some results.
This article also shows that aggregates in polymer solutions could cause small defects to appear on thin polymer films.

Microscopic Analysis, Raman Spectroscopy, TOF-SIMS, Dynamic Light Scattering, Aggregates, Small Defects