English Abstract
Recent Progress of Surface Analysis of Polymers
2. Surface and Structure Analysis of Thin Polymer Films

Shin-ichi KIMURA
JSR Corporation, Material Characterization and Analysis Laboratory, Mie
Nippon Gomu Kyokaishi,(2006),79(5),290-296 General Review in Japanese

Advanced analytical measurements which use synchrotron radiation, sum frequency generation and positron annihilation have been applied to the surface and fine structure analysis of thin polymeric films.
The outline of each measurement and applications to polymeric materials are explained
briefly, and examples of measurements in thin polymeric films are shown.

Fine Structure of Thin Polymer Film, NEXAFS, GIXS, X-ray Reflectivity, SFG, Positron Annihilation