English Abstract
Characterization of Adhesion Interlayer between Rubber and Brass by a Novel Method of Sample Preparation, Part2. SEM-EDX Analysis of Adhesion Interlayer by Exposing Reaction Layer Using Filter
Takeshi Hotaka
Yokohama Rubber Co., Ltd., Kanagawa, Japan
Yasuhiro Ishikawa
Yokohama Rubber Co., Ltd., Kanagawa, Japan
Kunio Mori
Department of Applied Chemistry, Faculty of Engineering, Iwate University, Iwate, Japan
Nippon Gomu Kyokaishi, (2004), 77(7), 244-249 Original Paper in Japanese.

We have previously succeeded in analyzing a clean adhesion interface by XPS utilizing a specific sample preparation of composite in which a filter paper was inserted between rubber and brass during the vulcanization. In this study, morphology of the interlayer was examined by SEM-EDX, in addition to the characterization of elemental distribution. Cu2S was found to be spherical at the interface for unaged specimens. Since Cu2S tended to corrupt gradually by an emission of electron beam during the SEM analysis, Cu2S was assumed to be amorphous. From the specimen aged under a humid environment, morphology of the Cu2S was found to be ragged crystalline. SEM image revealed that Cu2S did not corrupt during the emission of electron beam, which suggests the change in morphology from soft amorphous to rigid crystalline during the aging under humid conditions. Crystallization of Cu2S may lower the adhesion strength owing to decreased surface area and increased brittleness of the interfacial structure. ZnO tended to grow at the interface in the specimen aged with hot water. ZnO was found to occur during the aging in hot water by dezincification with moisture along with the migration from rubber matrix.

Scanning Electron Microscope - Energy Dispersive X-ray Spectrometer (SEM-EDX), Brass Plate, Adhesion Interlayer, Filter, Copper Sulfide, Zinc Oxide, Amorphous, Crystallization